Thin Film Processes, Volume 1John L. Vossen, Werner Kern Remarkable advances have been made in recent years in the science and technology of thin film processes for deposition and etching. It is the purpose of this book to bring together tutorial reviews of selected filmdeposition and etching processes from a process viewpoint. Emphasis is placed on the practical use of the processes to provide working guidelines for their implementation, a guide to the literature, and an overview of each process. |
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Page 264
... reactants . AG is related to the equilibrium constant k ,,, which is itself related to par- tial pressures in the system : -AG 2.3 RT log kp ; kp = = = n Пl 1_ , P , products II n II i = 1 i = 1 P ; reactants In CVD , one usually deals ...
... reactants . AG is related to the equilibrium constant k ,,, which is itself related to par- tial pressures in the system : -AG 2.3 RT log kp ; kp = = = n Пl 1_ , P , products II n II i = 1 i = 1 P ; reactants In CVD , one usually deals ...
Page 274
... reactant and by - product species relative to their surface reaction rate to form the film deposit . At normal ... reactants to and by - products from the substrate surface , and the rate - determining step in the sequence is the ...
... reactant and by - product species relative to their surface reaction rate to form the film deposit . At normal ... reactants to and by - products from the substrate surface , and the rate - determining step in the sequence is the ...
Page 294
... reactants in a given type of CVD reaction often ( but not always ) leads to films of mixed oxides or sili- cate glasses . The CVD reactions employed are those we discussed for sin- gle component oxides . However , the resulting ratio of ...
... reactants in a given type of CVD reaction often ( but not always ) leads to films of mixed oxides or sili- cate glasses . The CVD reactions employed are those we discussed for sin- gle component oxides . However , the resulting ratio of ...
Contents
Glow Discharge Sputter Deposition | 13 |
Equipment Configuration | 31 |
Preconditioning of Targets Substrates and Systems for Film | 41 |
Copyright | |
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Å/min alloys anode Appl applications argon atoms bias bombardment cathode Chem chemical coatings composition compounds current density deposition rate dielectric discharge power effect electric Electrochem electron electroplating energy Epitaxial etch rate etchants etching processes film deposition flow rate GaAs gases glow discharge polymerization H₂ H₂O heating HNO3 increase ion beam deposition ion source ionization layer mA/cm² magnetic field magnetron mask metal mTorr N₂ nitride O₂ operation oxide photoresist Phys planar plasma plasma etching plating PM sputtering polishing polymer polymer deposition potential pressure Proc produce ratio reactants reaction reactive sputtering reactor Section semiconductor shown in Fig silicon silicon nitride SiO2 solution species sputter deposition Sputter Gun sputtering yield starting material stoichiometry substrate susceptor target surface techniques Technol temperature thermal thickness Thin Film Thin Solid Films tion U.S. Patent uniform vacuum vapor voltage wafer York µm/min