Multisensor Instrumentation 6σ Design: Defined Accuracy Computer-Integrated Measurement Systems

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John Wiley & Sons, Mar 19, 2003 - Technology & Engineering - 224 pages
A groundbreaking book based on a landmark quality initiative

In today's information-driven enterprises, accuracy is essential in computer-integrated measurement and control systems, where academia, government, and industry invest considerable resources in methodologies for achieving and maintaining high performance. Multisensor Instrumentation 6σ Design offers a blueprint-drawn from the author's thirty years of experience at federal laboratories, steel producers, and General Electric-for defined-accuracy computer-based measurement and control instrumentation. Based on GE's Six-Sigma initiative, which was described by GE Chairman and CEO Jack Welch as "the most important initiative this company has ever undertaken," it presents a proven methodology for defining, measuring, analyzing, improving, and controlling the quality of enterprise products, processes, and transactions.

Multisensor Instrumentation 6σ Design offers readers:

  • A proven measurement and process control resource based on an important industry initiative
  • Expert pedagogy from an author with many years of practical industry involvement and electrical engineering instruction
  • A professional reference and textbook with a solutions manual
  • Accompanying user-interactive error-modeling software instrumentation design and spreadsheet

An important resource for electrical and computer engineering students and practitioners, as well as professionals in such fields as manufacturing, biotechnology, and process systems, Multisensor Instrumentation 6σ Design is universally applicable to all fields that employ real-time computer integration of processes and transactions.

An Instructor's Manual presenting detailed solutions to all the problems in the book is available from the Wiley editorial department.

 

Contents

1 Process Quantum and Analytical Sensors
1
2 Instrumentation Amplifiers and Parameter Errors
25
3 Active Filter Design with Nominal Error
47
4 Linear Signal Conditioning to SixSigma Confidence
75
5 Data Conversion Devices and Errors
95
6 Sampling and Reconstruction with Intersample Error
121
7 Measurement and Control Instrumentation Error Analysis
147
8 Multisensor Architectures and Error Propagation
169
9 Instrumentation System Integration and Interfaces
187
Index
209
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About the author (2003)

PATRICK H. GARRETT is an electrical engineering faculty member at the University of Cincinnati, where he has developed courses in manufacturing, controls, and process instrumentation. He holds several engineering degrees and has written five textbooks on instrumentation and process control that have been adopted internationally. He continues to be involved in long-term research projects, for both government and private sectors focused on performance advancement of information-intensive real-time systems.

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