## Elements of X-ray DiffractionIntended to acquaint the reader with the theory of x-ray diffraction, the experimental methods involved, and the main applications. The book is a collection of principles and methods stressing X-ray diffraction rather than metallurgy. The book is written entirely in terms of the Bragg law and can be read without any knowledge of the reciprocal lattice. It is divided into three main parts— Fundamentals; experimental methods; and applications. Designed for beginners, not as a reference tool for the advanced reader. |

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Results 1-3 of 39

Page 220

Thus, if a single measurement gives 1000 counts, then the probable

V1000 = 2.1 percent or 21 counts. Then the probability is 0.5 that this count lies in

the range N, + 21, where N, is the true number of counts, while the probability is ...

Thus, if a single measurement gives 1000 counts, then the probable

**error**is 671V1000 = 2.1 percent or 21 counts. Then the probability is 0.5 that this count lies in

the range N, + 21, where N, is the true number of counts, while the probability is ...

Page 354

The

AS' = 20 N = 2Ax sin 24). (11-6) The effect of a specimen displacement at right

angles to the incident beam [Fig. 11–3(b)] is to shift the lines from A to C and from

...

The

**error**in S' is then (AC + DB) = 2DB, which is approximately equal to 2ON, orAS' = 20 N = 2Ax sin 24). (11-6) The effect of a specimen displacement at right

angles to the incident beam [Fig. 11–3(b)] is to shift the lines from A to C and from

...

Page 359

surface are flat, no focusing of the diffracted rays occurs, and the result is that the

diffraction lines are much broader than is normally desirable for precise

measurement of their positions. The chief sources of systematic

following: 1.

surface are flat, no focusing of the diffracted rays occurs, and the result is that the

diffraction lines are much broader than is normally desirable for precise

measurement of their positions. The chief sources of systematic

**error**are thefollowing: 1.

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### Contents

The characteristic spectrum | 8 |

Filters | 19 |

Detection of xrays | 27 |

Copyright | |

25 other sections not shown

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### Common terms and phrases

absorption alloy angle arrangement atoms axes axis Bragg calculated called camera cause circle consider constant contains corresponding counter counting crystal cubic curve depends described determined diffracted beam diffraction lines diffractometer direction distance effect electron elements energy equal equation error example factor Figure film given gives grain hexagonal incident beam increases indices intensity involved kind known lattice Laue less located means measured metal method normal Note observed obtained occur orientation parallel parameter particular pattern percent phase photographic plane pole position possible powder problem produced projection proportional pulses radiation rays reference reflection relation relative result rotation sample scattering shown in Fig shows simple single solid solution spacing specimen sphere standard stress structure substance surface temperature transmission tube twin unit cell usually various vector voltage wave wavelength x-ray zone