Elements of X-ray Diffraction |
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Page xii
... ANALYSIS ( SINGLE PHASE ) 14-7 Chemical analysis by parameter measurement 388 QUANTITATIVE ANALYSIS ( MULTIPHASE ) 14-8 Basic principles 388 14-9 Direct comparison method 391 14-10 Internal standard method 396 14-11 Practical ...
... ANALYSIS ( SINGLE PHASE ) 14-7 Chemical analysis by parameter measurement 388 QUANTITATIVE ANALYSIS ( MULTIPHASE ) 14-8 Basic principles 388 14-9 Direct comparison method 391 14-10 Internal standard method 396 14-11 Practical ...
Page 378
... analysis . Qualitative analysis for a par- ticular substance is accomplished by identification of the pattern of that substance . Quantitative analysis is also possible , because the intensities of the diffraction lines due to one ...
... analysis . Qualitative analysis for a par- ticular substance is accomplished by identification of the pattern of that substance . Quantitative analysis is also possible , because the intensities of the diffraction lines due to one ...
Page 388
... ANALYSIS ( SINGLE PHASE ) 14-7 Chemical analysis by parameter measurement . The lattice pa- rameter of a binary solid solution of B in A depends ... analysis by parameter measurement QUANTITATIVE ANALYSIS (MULTIPHASE) 14-8 Basic principles.
... ANALYSIS ( SINGLE PHASE ) 14-7 Chemical analysis by parameter measurement . The lattice pa- rameter of a binary solid solution of B in A depends ... analysis by parameter measurement QUANTITATIVE ANALYSIS (MULTIPHASE) 14-8 Basic principles.
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cosē counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone