Elements of X-ray Diffraction |
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Page 166
... causes . The two effects together may cause the weakest diffraction line to be almost invisible in relation to the background . This background intensity is due to the following causes : ( 1 ) Fluorescent radiation emitted by the ...
... causes . The two effects together may cause the weakest diffraction line to be almost invisible in relation to the background . This background intensity is due to the following causes : ( 1 ) Fluorescent radiation emitted by the ...
Page 265
... cause of broadening , with grain fragmentation possibly a minor contributing cause . Actually , it is impossible to generalize , inasmuch as different metals and alloys may behave quite differently . By advanced methods of mathematical ...
... cause of broadening , with grain fragmentation possibly a minor contributing cause . Actually , it is impossible to generalize , inasmuch as different metals and alloys may behave quite differently . By advanced methods of mathematical ...
Page 398
... cause a variation in maximum intensity independent of sample composition . 14-11 Practical difficulties . There are certain effects which can cause great difficulty in quantitative analysis because they cause observed in- tensities to ...
... cause a variation in maximum intensity independent of sample composition . 14-11 Practical difficulties . There are certain effects which can cause great difficulty in quantitative analysis because they cause observed in- tensities to ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cosĀ² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone