Elements of X-ray Diffraction |
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Page 10
... electron out of the K shell of a target atom . If WK is the work required to remove a K electron , then the necessary kinetic energy of the electrons is given by mv2 = WK . ( 1-8 ) It requires less energy to remove an L electron than a K ...
... electron out of the K shell of a target atom . If WK is the work required to remove a K electron , then the necessary kinetic energy of the electrons is given by mv2 = WK . ( 1-8 ) It requires less energy to remove an L electron than a K ...
Page 191
... electrons and ions will be collected on the electrodes , and , if the x - ray intensity is constant , there will be ... electrons produced by the primary ionization are rapidly accelerated toward the wire anode and at an ever increasing ...
... electrons and ions will be collected on the electrodes , and , if the x - ray intensity is constant , there will be ... electrons produced by the primary ionization are rapidly accelerated toward the wire anode and at an ever increasing ...
Page 486
... electrons and neutrons have proved to be useful particles for the study of crystalline structure by diffraction and numerous applications of these techniques have been found in metal- lurgy . The differences between x - ray , electron ...
... electrons and neutrons have proved to be useful particles for the study of crystalline structure by diffraction and numerous applications of these techniques have been found in metal- lurgy . The differences between x - ray , electron ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cosĀ² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone