Elements of X-ray Diffraction |
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Page 407
... elements with atomic numbers greater than about 55 , and for such elements the L lines have to be used . Figure 15-3 shows how the wavelength of the strongest line in each of these series varies with atomic number . The upper limit of ...
... elements with atomic numbers greater than about 55 , and for such elements the L lines have to be used . Figure 15-3 shows how the wavelength of the strongest line in each of these series varies with atomic number . The upper limit of ...
Page 417
... elements are rapidly and directly indicated on a chart or set of dials . Because such spectrometers must be preset and precalibrated for each particular element determined , they are suitable only for control laboratories where large ...
... elements are rapidly and directly indicated on a chart or set of dials . Because such spectrometers must be preset and precalibrated for each particular element determined , they are suitable only for control laboratories where large ...
Page 488
... Elements with almost the same values of Z may have quite different neutron - scattering powers and elements with widely separated values of Z may scatter neutrons equally well . Furthermore , some light elements scatter neutrons more ...
... Elements with almost the same values of Z may have quite different neutron - scattering powers and elements with widely separated values of Z may scatter neutrons equally well . Furthermore , some light elements scatter neutrons more ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cosĀ² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone