Elements of X-ray Diffraction |
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Page 327
... error can be minimized by loading the film so that the inci- dent beam enters through a hole in the film , since corresponding back- reflection lines are then only a short distance apart on the film , and their separation S ' is little ...
... error can be minimized by loading the film so that the inci- dent beam enters through a hole in the film , since corresponding back- reflection lines are then only a short distance apart on the film , and their separation S ' is little ...
Page 328
... error refers to the possibility that the axis of rotation of the shaft is not located at the center of the camera , due to improper construction of the camera . Absorption in the specimen also causes an error in . This effect , often ...
... error refers to the possibility that the axis of rotation of the shaft is not located at the center of the camera , due to improper construction of the camera . Absorption in the specimen also causes an error in . This effect , often ...
Page 333
Bernard Dennis Cullity. errors . The opposite situation is shown in ( b ) : here the systematic error is small , but the wide scatter of the points shows that large random errors have been made . Inasmuch as the difficulty of drawing the ...
Bernard Dennis Cullity. errors . The opposite situation is shown in ( b ) : here the systematic error is small , but the wide scatter of the points shows that large random errors have been made . Inasmuch as the difficulty of drawing the ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cosĀ² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone