Elements of X-ray Diffraction |
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Page 154
... Film loading . Figure 6-5 illustrates three methods of arranging the film strip in the Debye method . The small sketches on the right show the loaded film in relation to the incident beam , while the films laid out flat are indicated on ...
... Film loading . Figure 6-5 illustrates three methods of arranging the film strip in the Debye method . The small sketches on the right show the loaded film in relation to the incident beam , while the films laid out flat are indicated on ...
Page 216
... film placed in the back - reflection position . C film , Z.A. zone axis . = crystal , F = mount sheet or plate specimens with their plane parallel to the plane of the film and one edge of the sheet or plate parallel to an edge of the ...
... film placed in the back - reflection position . C film , Z.A. zone axis . = crystal , F = mount sheet or plate specimens with their plane parallel to the plane of the film and one edge of the sheet or plate parallel to an edge of the ...
Page 218
... film distance D. The result is the Greninger chart , graduated at 2 ° inter- vals shown in Fig . 8-3 . The hyperbolas running from left to right are curves of constant y , and any one of these curves is the locus of diffraction spots ...
... film distance D. The result is the Greninger chart , graduated at 2 ° inter- vals shown in Fig . 8-3 . The hyperbolas running from left to right are curves of constant y , and any one of these curves is the locus of diffraction spots ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone