Elements of X-ray Diffraction |
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Page 94
... beam formed . If this plane is now rotated about the incident beam as axis in such a way that @ is kept constant , then the reflected beam will travel over the surface of a cone as shown in Fig . 3-11 ( b ) , the axis of the cone ...
... beam formed . If this plane is now rotated about the incident beam as axis in such a way that @ is kept constant , then the reflected beam will travel over the surface of a cone as shown in Fig . 3-11 ( b ) , the axis of the cone ...
Page 106
... incident beam is traveling in the direc- tion Ox ( Fig . 4-3 ) and encounters an electron at O. We wish to know the scattered intensity at P in the xz plane where OP is inclined at a scattering angle of 20 to the incident beam . An ...
... incident beam is traveling in the direc- tion Ox ( Fig . 4-3 ) and encounters an electron at O. We wish to know the scattered intensity at P in the xz plane where OP is inclined at a scattering angle of 20 to the incident beam . An ...
Page 107
... beam is only a minute fraction of the intensity of the incident beam . The equa- tion also shows that the scattered intensity decreases as the inverse square of the distance from the scattering electron , as one would expect , and that ...
... beam is only a minute fraction of the intensity of the incident beam . The equa- tion also shows that the scattered intensity decreases as the inverse square of the distance from the scattering electron , as one would expect , and that ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cosĀ² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone