Elements of X-ray Diffraction |
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Page 205
... measured than when the unavoidable background is completely negligible by comparison , if the same accuracy is to be obtained in both measurements . As indicated in Sec . 7-2 , the integrated intensity of a diffraction line may be measured ...
... measured than when the unavoidable background is completely negligible by comparison , if the same accuracy is to be obtained in both measurements . As indicated in Sec . 7-2 , the integrated intensity of a diffraction line may be measured ...
Page 446
... measured directly with a diffractometer , it is convenient to write the stress equation in terms of 20 rather than ... measurements 446 [ CHAP . 17 STRESS MEASUREMENT.
... measured directly with a diffractometer , it is convenient to write the stress equation in terms of 20 rather than ... measurements 446 [ CHAP . 17 STRESS MEASUREMENT.
Page 449
... measured in the ordinary way during a tensile test are to be used in calculating the value of K. But these mechanically measured values are not necessarily the correct ones to apply to a diffraction measurement . In the latter , strains ...
... measured in the ordinary way during a tensile test are to be used in calculating the value of K. But these mechanically measured values are not necessarily the correct ones to apply to a diffraction measurement . In the latter , strains ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cosĀ² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone