Elements of X-ray Diffraction |
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Page 89
... methods : λ Ө Laue method Variable Fixed Rotating - crystal method Fixed Powder method Fixed Variable ( in part ) Variable The Laue method was the first diffraction method ever used , and it re- produces von Laue's original experiment ...
... methods : λ Ө Laue method Variable Fixed Rotating - crystal method Fixed Powder method Fixed Variable ( in part ) Variable The Laue method was the first diffraction method ever used , and it re- produces von Laue's original experiment ...
Page 149
... methods and , when properly employed , can yield a great deal of structural information about the material under investigation . Basi- cally , this method involves the diffraction of monochromatic x - rays by a powder specimen . In this ...
... methods and , when properly employed , can yield a great deal of structural information about the material under investigation . Basi- cally , this method involves the diffraction of monochromatic x - rays by a powder specimen . In this ...
Page 510
... method , 94 errors , 326 Debye - Scherrer method ( continued ) film loading , 154 intensity equation , 132 specimen preparation , 153 DECKER , B. F. , 285 Defect structures , 317 , 353 Deformation texture , 273 Deformation twins , 58 ...
... method , 94 errors , 326 Debye - Scherrer method ( continued ) film loading , 154 intensity equation , 132 specimen preparation , 153 DECKER , B. F. , 285 Defect structures , 317 , 353 Deformation texture , 273 Deformation twins , 58 ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone