Elements of X-ray Diffraction |
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Results 1-3 of 83
Page 133
... Obtained from Appendix 7. Needed to determine fcu Column 8 : Read from the curve of Fig . 4-6 . Column 9 : Obtained from the relation F2 Column 10 : Obtained from Appendix 9 . = 16fcu2 . Column 11 : Obtained from Appendix 10 . Column 12 ...
... Obtained from Appendix 7. Needed to determine fcu Column 8 : Read from the curve of Fig . 4-6 . Column 9 : Obtained from the relation F2 Column 10 : Obtained from Appendix 9 . = 16fcu2 . Column 11 : Obtained from Appendix 10 . Column 12 ...
Page 382
... obtained with a Debye - Scherrer camera and Mo Ka radia- tion . Since a change in wavelength alters the relative intensities of the diffraction lines , this means that a pattern made with Cu Ka radiation , for example , may not be ...
... obtained with a Debye - Scherrer camera and Mo Ka radia- tion . Since a change in wavelength alters the relative intensities of the diffraction lines , this means that a pattern made with Cu Ka radiation , for example , may not be ...
Page 393
... obtained from a measurement of I and a calculation of R , and Ra . Once cy / ca is found , the value of c , can be obtained from the additional relationship : Cy + ca = 1 . We can thus make an absolute measurement of the austenite ...
... obtained from a measurement of I and a calculation of R , and Ra . Once cy / ca is found , the value of c , can be obtained from the additional relationship : Cy + ca = 1 . We can thus make an absolute measurement of the austenite ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
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Common terms and phrases
absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cosĀ² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone