Elements of X-ray Diffraction |
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Page 38
... parallel to a certain crystallographic axis , because such a plane does not intercept that axis , i.e. , its " intercept " can only be described as " infinity . " To avoid the introduction of infinity into the description of plane ...
... parallel to a certain crystallographic axis , because such a plane does not intercept that axis , i.e. , its " intercept " can only be described as " infinity . " To avoid the introduction of infinity into the description of plane ...
Page 124
... parallel monochro- matic rays , and let the crystal be rotated at a uniform angular velocity about an axis through O and normal to the drawing , so that a particular set of reflecting planes , assumed for convenience to be parallel to ...
... parallel monochro- matic rays , and let the crystal be rotated at a uniform angular velocity about an axis through O and normal to the drawing , so that a particular set of reflecting planes , assumed for convenience to be parallel to ...
Page 276
... parallel or nearly parallel to the sheet surface . As an illustration , the 200 diffractometer reflection from a specimen having the cube texture is abnormally high , and from this fact alone it is possible to conclude that there is a ...
... parallel or nearly parallel to the sheet surface . As an illustration , the 200 diffractometer reflection from a specimen having the cube texture is abnormally high , and from this fact alone it is possible to conclude that there is a ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cosĀ² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone