Elements of X-ray Diffraction |
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Page 225
... plotted on the vertical axis of the pro- jection at an angle y from the circumference , as in ( b ) . ( Note that zone A itself is represented by a great circle located at an angle y above the center of the pro- jection . However , the ...
... plotted on the vertical axis of the pro- jection at an angle y from the circumference , as in ( b ) . ( Note that zone A itself is represented by a great circle located at an angle y above the center of the pro- jection . However , the ...
Page 275
... plotted on the projection . If the grains have a completely random orientation , these poles will be dis- tributed uniformly * over the projection , as indicated in Fig . 9-7 ( a ) . But if preferred orientation is present , the poles ...
... plotted on the projection . If the grains have a completely random orientation , these poles will be dis- tributed uniformly * over the projection , as indicated in Fig . 9-7 ( a ) . But if preferred orientation is present , the poles ...
Page 283
... plotted on the 0 ° reflec- tion circle , as though the projection plane were still perpendicular to the incident beam , and then rotated to the right along latitude circles onto the 40 ° reflection circle . Thus , arc M1N1 in Fig . 9-13 ...
... plotted on the 0 ° reflec- tion circle , as though the projection plane were still perpendicular to the incident beam , and then rotated to the right along latitude circles onto the 40 ° reflection circle . Thus , arc M1N1 in Fig . 9-13 ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone