Elements of X-ray Diffraction |
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Page 132
Bernard Dennis Cullity. 4-12 Intensities of powder pattern lines . We are now in a position to gather together the factors discussed in preceding sections into an equation for the relative intensity of powder pattern lines : = = 1 + cos2 ...
Bernard Dennis Cullity. 4-12 Intensities of powder pattern lines . We are now in a position to gather together the factors discussed in preceding sections into an equation for the relative intensity of powder pattern lines : = = 1 + cos2 ...
Page 299
... powder pattern of the un- known is obtained with a Debye - Scherrer camera or a diffractometer , the object being to cover as wide an angular range of 20 as possible . A camera such as the Seemann - Bohlin , which records diffraction ...
... powder pattern of the un- known is obtained with a Debye - Scherrer camera or a diffractometer , the object being to cover as wide an angular range of 20 as possible . A camera such as the Seemann - Bohlin , which records diffraction ...
Page 314
... pattern . Monoclinic and triclinic substances yield powder patterns of great com- plexity because the number of independent constants involved is now four and six , respectively . No generally successful method , either analytical or ...
... pattern . Monoclinic and triclinic substances yield powder patterns of great com- plexity because the number of independent constants involved is now four and six , respectively . No generally successful method , either analytical or ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cosĀ² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone