Elements of X-ray Diffraction |
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Page 27
... radiation and a thickness range of 0.00 to 0.02 mm . 1-5 . Graphically verify Eq . ( 1-13 ) for a lead absorber and Mo Ka , Rh Ka , and Ag Ka radiation . ( The mass absorption coefficients of lead for these radiations are 141 , 95.8 ...
... radiation and a thickness range of 0.00 to 0.02 mm . 1-5 . Graphically verify Eq . ( 1-13 ) for a lead absorber and Mo Ka , Rh Ka , and Ag Ka radiation . ( The mass absorption coefficients of lead for these radiations are 141 , 95.8 ...
Page 166
... radiation . All in all , Cu Ka radiation is generally the most useful . It cannot be employed with ferrous materials , however , since it will cause fluorescent radiation from the iron in the specimen ; instead , Co Ka , Fe Ka or Cr Ka ...
... radiation . All in all , Cu Ka radiation is generally the most useful . It cannot be employed with ferrous materials , however , since it will cause fluorescent radiation from the iron in the specimen ; instead , Co Ka , Fe Ka or Cr Ka ...
Page 407
... radiation of this wavelength by air and the counter window . This factor limits the elements detectable by fluorescence to those with atomic numbers greater than about 22 ( titanium ) . Ti Ka radiation ( = 2.75A ) is de- creased to one ...
... radiation of this wavelength by air and the counter window . This factor limits the elements detectable by fluorescence to those with atomic numbers greater than about 22 ( titanium ) . Ti Ka radiation ( = 2.75A ) is de- creased to one ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cosē counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone