Elements of X-ray Diffraction |
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Page 132
... relative integrated intensity , i.e. , the relative area under the curve of in- tensity vs. 20 . It should be noted that " integrated intensity " is not really intensity , since intensity is expressed in terms of energy crossing unit ...
... relative integrated intensity , i.e. , the relative area under the curve of in- tensity vs. 20 . It should be noted that " integrated intensity " is not really intensity , since intensity is expressed in terms of energy crossing unit ...
Page 190
... relative intensities . This means that Eq . ( 4-12 ) for the relative integrated intensity of a diffraction line from a powder specimen , namely , I = | F2p ( 2 1+ cos2 20 sin2 0 cos 0 ( 4-12 ) needs only the insertion of a temperature ...
... relative intensities . This means that Eq . ( 4-12 ) for the relative integrated intensity of a diffraction line from a powder specimen , namely , I = | F2p ( 2 1+ cos2 20 sin2 0 cos 0 ( 4-12 ) needs only the insertion of a temperature ...
Page 382
... relative intensities of the diffraction lines , this means that a pattern made with Cu Ka radiation , for example , may not be directly comparable with one in the file . Factors for converting intensities from a Cu Ka to a Mo Ka basis ...
... relative intensities of the diffraction lines , this means that a pattern made with Cu Ka radiation , for example , may not be directly comparable with one in the file . Factors for converting intensities from a Cu Ka to a Mo Ka basis ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cosĀ² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone