Elements of X-ray Diffraction |
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Page 164
... thickness for the transmission method , because the diffracted beams will be very weak or entirely absent if the specimen is either too thin ( insufficient volume of diffracting material ) or too thick ( excessive absorption ) . As will ...
... thickness for the transmission method , because the diffracted beams will be very weak or entirely absent if the specimen is either too thin ( insufficient volume of diffracting material ) or too thick ( excessive absorption ) . As will ...
Page 189
... thickness . * This The criterion adopted for " infinite thickness " depends on the sensitivity of our intensity measurements or on what we regard as negligible diffracted intensity . For example , we might arbitrarily but quite ...
... thickness . * This The criterion adopted for " infinite thickness " depends on the sensitivity of our intensity measurements or on what we regard as negligible diffracted intensity . For example , we might arbitrarily but quite ...
Page 421
... thickness . Fluorescent radiation can be utilized not only as a means of chemical analysis but also as a method for measuring the thickness of surface layers . The following methods , both ... THICKNESS 15-10 Measurement of coating thickness.
... thickness . Fluorescent radiation can be utilized not only as a means of chemical analysis but also as a method for measuring the thickness of surface layers . The following methods , both ... THICKNESS 15-10 Measurement of coating thickness.
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cosĀ² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone