Elements of X-ray Diffraction |
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Page v
... tion purely as a laboratory tool for the sort of problems already mentioned . Members of this group , unlike x - ray crystallographers , are not normally concerned with the determination of complex crystal structures . For this reason ...
... tion purely as a laboratory tool for the sort of problems already mentioned . Members of this group , unlike x - ray crystallographers , are not normally concerned with the determination of complex crystal structures . For this reason ...
Page 69
... tion being from W to E on the projection . Then A1 moves to A2 along its latitude circle as shown . B1 , however , can rotate only 40 ° before finding itself at the edge of the projection ; we must then imagine it to move 20 ° in from ...
... tion being from W to E on the projection . Then A1 moves to A2 along its latitude circle as shown . B1 , however , can rotate only 40 ° before finding itself at the edge of the projection ; we must then imagine it to move 20 ° in from ...
Page 241
... tion , as indicated by the shaded symbols ( Position 3 ) . The final orienta- tion is obtained by a 28 ° rotation about the N'S ' - axis , with the equator of the underlying Wulff net now horizontal ; the poles move to the positions ...
... tion , as indicated by the shaded symbols ( Position 3 ) . The final orienta- tion is obtained by a 28 ° rotation about the N'S ' - axis , with the equator of the underlying Wulff net now horizontal ; the poles move to the positions ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone