Elements of X-ray Diffraction |
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Page 19
... voltage across the tube . Surrounding the filament is a small metal cup maintained at the same high ( negative ) voltage as the filament : it therefore repels the electrons and tends to focus them into a narrow region of the target ...
... voltage across the tube . Surrounding the filament is a small metal cup maintained at the same high ( negative ) voltage as the filament : it therefore repels the electrons and tends to focus them into a narrow region of the target ...
Page 193
... voltage plateau . 7-6 Geiger counters . If the voltage on a proportional counter is in- creased some hundreds of volts , it will act as a Geiger counter . The exact operating voltage is determined in the following way . The counter is ...
... voltage plateau . 7-6 Geiger counters . If the voltage on a proportional counter is in- creased some hundreds of volts , it will act as a Geiger counter . The exact operating voltage is determined in the following way . The counter is ...
Page 199
... voltage the tube voltage exceeds the critical excitation voltage of the target mate- rial . Suppose , for example , that a copper target ( excitation voltage 9 kv ) is operated at a peak voltage of 50 kv . Then , if the wave form is ...
... voltage the tube voltage exceeds the critical excitation voltage of the target mate- rial . Suppose , for example , that a copper target ( excitation voltage 9 kv ) is operated at a peak voltage of 50 kv . Then , if the wave form is ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cosĀ² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone