Elements of X-ray Diffraction |
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Page 12
... wavelength less than a certain critical value . To say that the energy of the incoming quanta must exceed a certain value WK is equivalent to saying that the wavelength must be less than a certain value λK , since the energy per quantum ...
... wavelength less than a certain critical value . To say that the energy of the incoming quanta must exceed a certain value WK is equivalent to saying that the wavelength must be less than a certain value λK , since the energy per quantum ...
Page 413
... wavelength difference here is 0.018A and the mean wavelength 2.094A . The required resolution X / △ is therefore 2.094 / 0.018 or 116. The avail- able resolving powers are given by ( tan 0 ) / B , and are equal to 182 for curved mica ...
... wavelength difference here is 0.018A and the mean wavelength 2.094A . The required resolution X / △ is therefore 2.094 / 0.018 or 116. The avail- able resolving powers are given by ( tan 0 ) / B , and are equal to 182 for curved mica ...
Page 414
... wavelength . In spectrometry , however , each spectral line has a different wavelength , and variations in counter behavior with wavelength must be considered . The pulse size is inversely proportional to x - ray wavelength in propor ...
... wavelength . In spectrometry , however , each spectral line has a different wavelength , and variations in counter behavior with wavelength must be considered . The pulse size is inversely proportional to x - ray wavelength in propor ...
Contents
THE GEOMETRY OF CRYSTALS | 29 |
CHAPTER 3 | 78 |
CHAPTER 4 | 104 |
Copyright | |
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absorption coefficient absorption edge alloy atomic number austenite axes axis back-reflection Bragg angle Bragg law Bravais lattice calculated camera chart circle composition constant copper cos² counter counting rate cubic curve Debye ring Debye-Scherrer decreases determined diffracted beam diffraction lines diffraction pattern diffractometer direction distance effect electrons elements energy equation error example face-centered face-centered cubic factor film filter given grain hexagonal incident beam indices integrated intensity lattice parameter Laue method martensite measured metal normal obtained orthorhombic parallel percent phase photograph pinhole plotted point lattice pole figure position powder pattern produced pulses rays reciprocal lattice reflecting planes relative rhombohedral rotation sample scaler scattering shown in Fig slit solid solution spacing specimen sphere stereographic projection stress structure substance surface symmetry temperature tetragonal thickness tion transmission twin unit cell vector voltage wave wavelength x-ray beam x-ray diffraction x-ray tube zero zone