1985 Spring Meeting: Final Program and Abstracts, Materials Research Society 1985 Spring Meeting, April 15-18 Golden Gateway Holiday Inn, San Francisco, California |
From inside the book
Results 1-3 of 16
Page 201
... SYNCHROTRON RADIATION OPTICAL SYSTEMS . M. Howells , Center for X - ray Optics , Lawrence Berkeley Laboratory , Berkeley , CA 94720 The evolution of storage ring sources toward both lower emittance and higher photon power and power ...
... SYNCHROTRON RADIATION OPTICAL SYSTEMS . M. Howells , Center for X - ray Optics , Lawrence Berkeley Laboratory , Berkeley , CA 94720 The evolution of storage ring sources toward both lower emittance and higher photon power and power ...
Page 203
... SYNCHROTRON RADIATION OPTICS AND MATERIALS RESEARCH . Roman Tatchyn , Stanford Synchrotron Radiation Laboratory , Stanford University , Stanford , CA 94305 * Affiliate Member , Center for X - Ray Optics , Lawrence Berkeley Laboratory ...
... SYNCHROTRON RADIATION OPTICS AND MATERIALS RESEARCH . Roman Tatchyn , Stanford Synchrotron Radiation Laboratory , Stanford University , Stanford , CA 94305 * Affiliate Member , Center for X - Ray Optics , Lawrence Berkeley Laboratory ...
Page 210
... synchrotron radiation monochromators will be presented in this paper . G4.1 APPLICATION OF SYNCHROTRON RADIATION TO X - RAY TOPOGRAPHY . Z. Rek , Stanford Synchrotron Radiation Laboratory , Stanford , Ca 94305 X - ray topography is a ...
... synchrotron radiation monochromators will be presented in this paper . G4.1 APPLICATION OF SYNCHROTRON RADIATION TO X - RAY TOPOGRAPHY . Z. Rek , Stanford Synchrotron Radiation Laboratory , Stanford , Ca 94305 X - ray topography is a ...
Contents
Microscopic Identification of Electronic | 37 |
Thin Films The Relationship of Structure | 79 |
Symposium | 103 |
5 other sections not shown
Common terms and phrases
a-Si absorption alloy amorphous silicon analysis applications April 16 AT&T Bell Laboratories atoms Auger band gap Berkeley carrier characterization chemical composition concentration crystal crystalline deep levels defects density deposition depth profiling determined developed devices diffraction diffusion discussed disk donor dopant doped dose effects electrical electron microscopy energy epitaxial etching experimental formation function GaAs grain hydrogen impurities interface investigated Invited talk ion beam ion implantation Japan laser layers magnetic Materials Research measurements metal microstructure Murray Hill National Laboratory nitride observed obtained optical oxide oxygen Palo Alto parameters photoconductivity Physics polymer properties rapid thermal annealing Research Center Research Laboratory resonance Rutherford backscattering samples Sandia National Laboratories scanning Schottky secondary ion semiconductors SESSION silicide SIMS soft x-ray solar cells spectra spectrometry spectroscopy sputtering Stanford structure substrate surface synchrotron radiation technique Technology temperature thickness thin films transmission electron microscopy wafers Yorktown Heights